IFA-640-E is an automatic alignment system designed for Si-photonics wafer.
The system consists of “Probe station module”, “Optical Alignment module”, and “Measurement module”.
产品特性
- Wafer level tester upto 12 inch wafer
- Automatic input / output coupling (wafer level vertical coupling)
- Coupling to fiber array blocks and / or optical fiber
- Convenient Graphic User Interface (GUI) with the capability of user programmable operation / measurement sequences
- Versatile alignment functions using image processing and contact sensor
应用范围
- 针对Lens, Collimator, Fiber Array Block, Fiber, Optic Filter等各种光器件通过可替换的夹具(e.g. gripper, FAB jig, Electrical probes, Highly customizable Jigs) 提供垂直及水平方向的耦合方案.
- 科学研究
